Kim, S., Kim, Y., Sugita, N., & Mitsuishi, M. (2023). Surface Topography of Transparent Plate Using Fizeau Interferometer with Suppression of Intensity Modulation. International Journal of Precision Engineering and Manufacturing-Smart Technology, 1(2), 157–163. https://doi.org/10.57062/ijpem-st.2023.0031
Manufacturing Laboratory, the University of Tokyo