Kim, S., Kim, Y., Hibino, K., Sugita, N., & Mitsuishi, M. (2022). Interferometric thickness assessment of optical flat by combining iterative analysis and wavelength tuning. Optik, 169450. https://doi.org/10.1016/j.ijleo.2022.169450
Manufacturing Laboratory, the University of Tokyo
Kim, S., Kim, Y., Hibino, K., Sugita, N., & Mitsuishi, M. (2022). Interferometric thickness assessment of optical flat by combining iterative analysis and wavelength tuning. Optik, 169450. https://doi.org/10.1016/j.ijleo.2022.169450