Jeon, J., Kim, Y., Ito, Y., Sugita, N., & Hibino, K. (2025). Glass thickness testing using Fizeau interferometer with suppression of environmental factors. Precision Engineering, 93, 99–109. https://doi.org/10.1016/j.precisioneng.2024.12.017
Manufacturing Laboratory, the University of Tokyo
Jeon, J., Kim, Y., Ito, Y., Sugita, N., & Hibino, K. (2025). Glass thickness testing using Fizeau interferometer with suppression of environmental factors. Precision Engineering, 93, 99–109. https://doi.org/10.1016/j.precisioneng.2024.12.017