Kim, H., Jeon, J., Kim, S., Kim, Y., & Sugita, N. (2023). Simultaneous interferometric profilometry of surface and thickness of transparent plate using wavelength-modulation. Optik, 295, 171523. https://doi.org/10.1016/j.ijleo.2023.171523
Manufacturing Laboratory, the University of Tokyo
Kim, H., Jeon, J., Kim, S., Kim, Y., & Sugita, N. (2023). Simultaneous interferometric profilometry of surface and thickness of transparent plate using wavelength-modulation. Optik, 295, 171523. https://doi.org/10.1016/j.ijleo.2023.171523