Paper : Optik

Kim, S., Kim, Y., Hibino, K., Sugita, N., & Mitsuishi, M. (2022). Interferometric thickness assessment of optical flat by combining iterative analysis and wavelength tuning. Optik, 169450.

Paper : Applied Physics A

Sun, H., Ito, Y., Ren, G., Hattori, J., Nagato, K., & Sugita, N. (2022). Observation of damage generation induced by electron excitation and stress wave propagation during ultrashort pulse laser drilling of sapphire. Applied Physics A, 128(6), 547.