Month: February 2022

Jeon, J., Kim, Y., Kim, S., Hibino, K., & Sugita, N. (2022). Fringe analysis for thickness estimation of optical glass plate using Fizeau interferometer. Optics Communications, 128086. https://doi.org/10.1016/j.optcom.2022.128086

Kim, S., Kim, Y., Sugita, N., & Mitsuishi, M. (2022). Surface measurement of silicon wafer using harmonic phase-iterative analysis and wavelength-scanning Fizeau interferometer. Precision Engineering. https://doi.org/10.1016/j.precisioneng.2022.02.005

Inoue, T., Kizaki, T., & Sugita, N. (2022). Structural components with sensing capability of THREE-dimensional temperature distribution for thermal deformation prediction. Precision Engineering. https://doi.org/10.1016/j.precisioneng.2021.12.010

Ren, G., Ito, Y., Sun, H., & Sugita, N. (2022). Temporal-spatial characteristics of filament induced by a femtosecond laser pulse in transparent dielectrics. Optics Express, 30(4), 4954. https://doi.org/10.1364/OE.449874