Bae, J., Kim, Y., Ito, Y., Sugita, N., & Mitsuishi, M. (2025). Quality enhancement of interferometric fringe pattern based on deep-learning-based denoising of combined noise. Precision Engineering, 95, 75–88. https://doi.org/10.1016/j.precisioneng.2025.04.021
Manufacturing Laboratory, the University of Tokyo